Non-SCI & Patents

Patent · USA · Granted

Automated Mapping Method of Crystalline Structure and Orientation of Polycrystalline Material with Deep Learning

Inventors: Young-Min Kim, Eunha Lee, Myoungho Jeong, Young-Hoon Kim, Sang-Hyeok Yang

Patent No. US12487196B2

Patent · Korea · Granted

플루오라이트 산화물에서의 이온빔 조사를 통한 결정구조 제어 (Crystal structure control via ion beam irradiation in fluorite oxides)

Inventors: 김윤석, 강승훈, 김영민, 장우성, 김선국, 조해원

Appl. 10-2022-0125937 (October 4, 2022) · Reg. 10-2751803 (January 3, 2025)

Patent · Korea · Applied

딥러닝 기반 다결정 소재의 결정 구조 및 배향 자동 맵핑법 (Deep learning-based automated mapping of polycrystalline crystal structure and orientation)

Inventors: 김영민, 이은하, 정명호, 김영훈, 양상혁

Appl. 10-2022-0060095 (May 17, 2022)

New Physics: Sae Mulli · 72, 812-820

Grain Boundaries and Twin Boundaries in Cu(111) Thin Films

Su Jae Kim, Young-Hoon Kim, Young-Min Kim, Se-Young Jeong

Patent · Korea · Granted

이산화티타늄 코어-쉘 구조체 및 이의 제조 방법 (Titanium dioxide core-shell structure and manufacturing method)

Inventors: 김영민, 한경탁, 이한길

Appl. 10-2020-0020803 (February 20, 2020) · Reg. 10-2308030 (September 27, 2021)

Patent · Korea · Applied

포스포린-니켈 인화물 복합체 및 이의 제조방법 (Phosphorin-nickel phosphide complex and manufacturing method)

Inventors: 박호석, 박재민, 강민수, 박태호, 고영훈, 김영민, 장우성, 나카니베즈, 푸리타

Appl. 10-2021-0060412 (May 11, 2021)

Applied Science and Convergence Technology · 30(2), 165-168

Universal transfer of 2D materials grown on Au substrate using sulfur intercalation

Soo Ho Choi, Ji Hoon Choi, Chang Seok Oh, Gyeongtak Han, Hu Young Jeong, Young-Min Kim, Soo Min Kim, Ki Kang Kim

Patent · Korea · Granted

점 결함 생성을 통한 원자 단위의 플렉소일렉트릭 효과 및 압전성 발현 (Atomic-level flexoelectric and piezoelectric effects via point defect generation)

Inventors: 김윤석, 강승훈, 김세라, 양희준, 설대희, 김영민, 장우성, 이재광, 전세라

Appl. 10-2019-0073959 (June 21, 2019) · Reg. 10-2220805 (February 22, 2021)

Patent · Korea · Granted

전이금속의 침입형 원자자리 도핑법에 의해 제조된 SnO₂ 나노입자 (SnO₂ nanoparticles via interstitial-site doping of transition metals)

Inventors: 김영민, 장우성, 이한길

Appl. 10-2019-0058530 (May 20, 2019) · Reg. 10-2190605 (December 8, 2020)

물리학과 첨단기술 · July/August, 13-20

투과전자현미경 기반 돌연경계의 원자레벨 구조-화학 분석 (Atomic-level TEM analysis of grain boundaries)

김영민

Patent · Korea · Granted

이차전지 양극 활물질용 전구체, 이의 제조 방법 및 이를 이용한 이차전지용 양극 활물질의 제조 방법 (Battery cathode active material precursor and manufacturing method)

Inventors: 심재현, 김영민, 오상호

Reg. 10-2016156 (August 23, 2019)

Book · 전북대학교출판문화원

신판 처음배우는 전자상태 계산: DV-Xa 분자궤도법 입문 (Introduction to electronic state calculation (DV-Xα molecular orbital method) — translated)

김양수, 김영민, 송호준, 조덕용 (역)

ISBN 979-11-6372-043-0 · September 30, 2019

Ceramist · 20(2), 66-73

원자단위 분석 주사투과전자현미경 (Atomic-level analytical scanning transmission electron microscopy)

김영민

Korean J. Electron Microsc. · 40, 47

VirtualDub as a useful program for video recording in real-time TEM analysis

Jin-Gyu Kim, Sang Ho Oh, Kyung Song, Seung Jo Yoo, Young-Min Kim

Korean J. Electron Microsc. · 39, 277

Cross-sectional TEM specimen preparation of GaN-based thinfilm materials using alumina dummy filler

Sang Ho Oh, Joo-Hyoung Choi, Kyung Song, Jong-Man Jeung, Jin-Gyu Kim, In Keun Yu, Suk Jae Yoo, Young-Min Kim

Korean J. Electron Microsc. · 39, 73

Experimentally minimized contaminative condition of carbonaceous artifacts in transmission electron microscope

Young-Min Kim, Joo-Hyoung Choi, Kyung Song, Yang-Soo Kim, Youn-Joong Kim

Korean J. Electron Microsc. · 39, 79

Estimation of electron dose rate using CCD camera

Jin-Gyu Kim, Young-Min Kim, Youn-Joong Kim, Sang-Hee Lee, Kimin Hong, Sang Ho Oh

J. Kor. Inst. Surf. Eng. · 42(1), 8-12

First principles study on factors determining battery voltages of TiS₂ and TiO₂

H.J. Kim, W.J. Moon, Y.-M. Kim, K.S. Bae, J.S. Yoon, Y.M. Lee, J.S. Gook, Y.S. Kim

Korean J. Electron Microsc. · 38, 383

Practical issues on in situ heating experiments in transmission electron microscope

Young-Min Kim, Jin-Gyu Kim, Yang-Soo Kim, Sang Ho Oh, Youn-Joong Kim

Korean J. Electron Microsc. · 38, 185

Imaging plate technique for the electron diffraction study of a radiation-sensitive material under electron beam

Young-Min Kim, Yang-Soo Kim, Jin-Gyu Kim, Jeong Yong Lee, Youn-Joong Kim

Adv. Mater. Res. · 26-28, 1195

New compositionally-ordered GeSi nanodots fabricated with 1250 keV electrons

Se Ahn Song, Liudmila I. Fedina, Hionsuck Baik, Youn-Joong Kim, Young-Min Kim, Anton K. Gutakovskii, Alexander V. Latyshev

Korean J. Electron Microsc. · 37, 111

Measurement of spherical aberration coefficient of the objective lens in KBSI-HVEM

Young-Min Kim, Hyo-Sik Shim, Youn-Joong Kim

Solid State Phenom. · 124-126, 33

Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer

Chang-Kyu Lee, Jong-Sung Kwon, In-Chul Na, Byung-Il Han, Young-Min Kim, Jae-Gun Park

Korean J. Electron Microsc. · 36, 209

Reliability test of the TEM rotation holder for 3-D structure analysis

Jin-Gyu Kim, Jong-Man Jeong, Young-Min Kim, Youn-Joong Kim

Korean J. Electron Microsc. · 36 (Special Issue 1), 1

HVEM application to electron crystallography: Structure refinement of SmZn_0.67Sb₂

Jin-Gyu Kim, Young-Min Kim, Ji-Soo Kim, Youn-Joong Kim

Korean J. Electron Microsc. · 35, 289

Enlargement of field-of-view (FOV) of the CCD camera by the current adjustment of the projection lens system in the KBSI-HVEM

Young-Min Kim, Hyo-Sik Shim, Youn-Joong Kim

Korean J. Electron Microsc. · 34, 13

First remote operation of the high voltage electron microscope newly installed in KBSI

Young-Min Kim, Jin-Gyu Kim, Youn-Joong Kim, Man-Hoi Hur, Kyung-Hoon Kwon

Korean J. Electron Microsc. · 33, 195

Accurate interpretation of electron diffraction data acquired by imaging plate

Young-Min Kim, Youn-Joong Kim

Korean J. Electron Microsc. · 32, 311

TEM specimen preparation method of gibbsite powder for quantitative structure analysis

Young-Min Kim, Jong Man Jeung, Sujeong Lee, Youn-Joon Kim